Sense amplifier using reference signal through standard mos and dram capacitor

ABSTRACT

A memory circuit includes a first memory cell node capacitor, a first memory cell node transistor, a second memory cell node having a second memory cell node capacitor and a second memory cell node transistor, and a pre-charging circuit for pre-charging the first and second memory cell nodes to first and second voltage levels, respectively. The circuit includes a reference memory cell having first and second reference cell transistors with an equalizing transistor between, and a sense amplifier that detects a potential difference between reference bit lines from the reference memory cell and the first or second memory cell node, respectively. The reference cell transistors and equalizing transistor perform a first voltage equalization of the memory cell nodes at a predetermined voltage and a second voltage equalization of the memory cell nodes based on first or second reference signals respectively input to the first or second reference cell transistor.

RELATED APPLICATION

The present application claims priority of India Patent Application No.1062/DEL/2010 filed May 6, 2010, which is incorporated herein in itsentirety by this reference.

FIELD OF THE INVENTION

The present invention relates to a memory circuit, specifically adynamic random access memory DRAM circuit, as well as a method of senseamplifying in such a memory circuit.

BACKGROUND

Ground sensing or VDD sensing schemes of DRAM circuits provide manyadvantages in improving memory performance. However, such sensingschemes require a unique reference cell for providing a referencevoltage for sensing. A conventional reference cell in a DRAM circuitgenerally comprises two access transistors and a single capacitor. Inorder to differentiate reference cell data from the memory cell data andprovide a reference voltage, the reference cell requires a particularpower supply voltage. It is difficult to obtain a stable, high currentpower supply voltage for the reference cell capacitor. Consequently,using such a power supply voltage as a sensing reference creates a lotof noise and degrades the sensing operation and memory performance. Inthe following, a memory circuit according to the art will be described.

FIG. 1 shows a memory device as disclosed in U.S. Pat. No. 6,914,840.The DRAM circuit comprises a memory cell having a memory cell capacitorand a reference cell having a reference cell capacitor. Referring toFIG. 1, the NMOS-type DRAM circuit 10 includes a memory cell 11, a CMOSsense amplifier 12, a precharge circuit 13, and a dummy cell 14. Thememory cell 11 is at the intersection of a word line WL and a bit lineBL. The CMOS sense amplifier 12 serves to sense and amplify a potentialdifference between the pair of bit lines BL and BLX. The prechargecircuit 13 precharges the bit line pair BL and BLX. The dummy cell 14 isprovided at the intersection of a dummy word line DWL and the bit lineBLX. The memory cell 11 is a 1-transistor cell composed of an NMOStransistor 111 and a main capacitor 112. The NMOS transistor 111 isturned on by activating the word line WL while the bit line BL isinactive, thereby electrically coupling the main capacitor 112 to thebit line BL.

The sense amplifier 12, which is activated by activation of a signalline SAP, detects a potential difference caused between the bit linepair BL and BLX, and puts one of the bit line pair BL and BLX to a powersupply voltage VDD (the activation voltage of the signal line SAP),while putting the other to a GND level. The precharge circuit 13, whichis activated by activating a signal line PRE when the word line WL andthe dummy word line DWL are inactive, precharges the bit line pair BLand BLX to the GND level. The dummy cell 14 is composed of NMOStransistors 141 and 142 and a dummy capacitor 143. The NMOS transistor141 is turned on by activation of the dummy word line DWL, whereby thedummy capacitor 143 is electrically coupled with the bit line BLX. TheNMOS transistor 142 is turned on by activating theprecharge-signal-supplying signal line PRE when the dummy word line DWLis inactive, thereby electrically coupling the dummy capacitor 143 and avoltage line VPRE with each other. The voltage line VPRE supplies thepower supply voltage VDD.

Another problem arising in the conventional memory devices according tothe art is that they require reference rows and constraints on thecharge pump. Further, they require a power supply voltage of VDD/2 topre-charge the reference store capacitor in the conventional senseamplifier. Uncontrolled variations in the reference signal may alsoarise. Some conventional memory devices according to the art implement asense amplifier using a large number of dummy rows, which represent anoverhead in the silicon area necessary to provide the memory circuit. Ahigh complexity is often associated with the generation of referencerows and reference pre-charging signals and constraints exist on thecharge pump to support the high voltage that drives the dummy rows. Anextra power supply of VDD/2 is necessary to pre-charge the referencestore capacitor of the dummy rows.

There is therefore a need for an improved memory circuit overcoming theabove mentioned disadvantages of the memory circuits according to theart.

SUMMARY

In view of the foregoing, disclosed herein are embodiments of a memorycircuit that incorporates a first memory cell node comprising a firstmemory cell node capacitor electrically coupled to a ground and a firstmemory cell node transistor, a second memory cell node comprising asecond memory cell node capacitor electrically coupled to a ground and asecond memory cell node transistor, a pre-charging circuit thatpre-charges said first memory cell node to a first voltage level andsaid second memory cell node to a second voltage level, respectively, areference memory cell comprising a first reference cell transistor, asecond reference cell transistor, and an equalizing transistor that isarranged between said first reference cell transistor and said secondreference cell transistor, and a sense amplifier that detects apotential difference between a reference bit line from said referencememory cell and a bit line from said first or second memory cell nodeduring a read operation of the memory circuit, wherein said firstreference cell transistor, said second reference cell transistor andsaid equalizing transistor perform a first voltage equalization of saidfirst memory cell node and said second memory cell node at apredetermined voltage and a second voltage equalization of said firstmemory cell node and said second memory cell node based on one of afirst reference signal and a second reference signal that arerespectively input to said first reference cell transistor and saidsecond reference cell transistor.

Also disclosed herein are embodiments of a method of sense amplifying ina memory circuit.

According to an embodiment of the invention, the first memory cell nodetransistor electrically couples the first memory cell node capacitor toa first bit line when a first word line is active, and the second memorycell node transistor electrically couples the second memory cell nodecapacitor to a second bit line when a second word line is active.

According to a further embodiment of the invention, the first voltageequalization of the first memory cell node and second memory node at apredetermined voltage is performed when the equalization transistor isturned on.

According to yet another embodiment of the invention, the predeterminedvoltage is essentially half of the first voltage level.

According to another embodiment of the invention, a voltage level on theobtained reference bit line is essentially half of the correspondingsignal on the true bit line.

According to yet another embodiment of the invention, the senseamplifier comprises a logic gate arrangement and a transistor to which asignal is input.

BRIEF DESCRIPTION OF THE DRAWINGS

The embodiments of the invention will be better understood from thefollowing detailed description with reference to the drawings, in which:

FIG. 1 is a schematic diagram illustrating a prior art DRAM circuit;

FIG. 2 is a schematic diagram illustrating a memory circuit according toan embodiment of the present invention;

FIG. 3 is a diagram representing the voltage levels of different signalsin the case of refresh of 1 as a function of time; and

FIG. 4 is a diagram representing the voltage levels of different signalsin the case of refresh of 0 as a function of time.

DETAILED DESCRIPTION OF PREFERRED EMBODIMENTS

Embodiments of the invention and the various features and advantageousdetails thereof are explained more fully with reference to thenon-limiting embodiments that are illustrated in the accompanyingdrawings and detailed in the following description. It should be notedthat the features illustrated in the drawings are not necessarily drawnto scale. Descriptions of well-known components and processingtechniques are omitted so as to not unnecessarily obscure theembodiments of the invention. The examples used herein are intendedmerely to facilitate an understanding of ways in which the embodimentsof the invention may be practiced and to further enable those of skillin the art to practice the embodiments of the invention. Accordingly,the examples should not be construed as limiting the scope of theembodiments of the invention.

A memory circuit 20 according to an embodiment of the present inventionis represented in FIG. 2. The memory circuit 20 comprises a first memorycell node comprising a first memory cell node capacitor 212 electricallycoupled to VDD/2 and a first memory cell node transistor 211. The memorycircuit 20 further comprises a second memory cell node comprising asecond memory cell node capacitor 214 electrically coupled to VDD/2 anda second memory cell node transistor 213. The memory circuit 20 furthercomprises a pre-charging circuit 23 that pre-charges the first memorycell node to a first voltage level VDD and the second memory cell nodeto a second voltage level VGND, respectively.

As apparent from FIG. 2, the memory circuit 20 according to anembodiment of the present invention further comprises a reference memorycell 21 comprising a first reference cell transistor 215, a secondreference cell transistor 216, and an equalizing transistor 217. Theequalizing transistor 217 is arranged between the first reference celltransistor 215 and the second reference cell transistor 216. The firstreference cell transistor 215, second reference cell transistor 216 andequalizing transistor 217 are arranged with respect to each other suchthat they can perform a first voltage equalization of the first memorycell node and the second memory cell node at a predetermined voltageVDD/2. Further, the first reference cell transistor 215, secondreference cell transistor 216 and equalizing transistor 217 are capableof performing a second voltage equalization of the first memory cellnode and second memory cell node based on one of a first referencesignal and a second reference signal that are respectively input to thefirst reference cell transistor 215 and the second reference celltransistor 216.

Moreover, the memory circuit 20 according to an embodiment of thepresent invention comprises a sense amplifier 22 that detects apotential difference between a reference bit line from the referencememory cell 21 and a bit line from the first or second memory cell nodeduring a read operation of the memory circuit. The sense amplifier 22comprises a logic gate arrangement 221-0, 221-1 and a transistor 222 towhich a signal is input.

In the memory circuit 20 according to an embodiment of the invention,the first memory cell node transistor 211 electrically couples the firstmemory cell node capacitor 212 to a first bit line when a first wordline is active, and the second memory cell node transistor 213electrically couples the second memory cell node capacitor 214 to asecond bit line when a second word line is active.

In the following, the working principle of the memory circuit 20according to an embodiment of the invention will be explained.

A reference signal is generated in a reference bit line using acapacitor of a memory cell. The first memory cell node is pre-charged toa first voltage level VDD and the second memory cell node to a secondvoltage level VGND, respectively, by the pre-charging circuit 23. Thevoltage levels at the first memory cell node and second memory cell nodeare then equalized in a first voltage equalizing step at a predeterminedvoltage VDD/2, when the equalizing transistor 217 of the referencememory cell 21 is turned on. The voltage levels at the first memory cellnode and second memory cell node are then equalized again in a secondvoltage equalizing step with the respective true bit line BLT of therespective memory cell or the complementary bit line BLC of the memorycell based on the respective reference signals REFC and REFT signalsthat are input to the first reference cell transistor 215 and the secondreference cell transistor 216.

After this second voltage equalization step of the first resp. secondmemory cell node with the first resp. second reference signal REFC orREFT, the reference bit line has a signal thereon that is essentiallyhalf of the signal on the true bit line. The signal on the reference bitline and the signal on the true bit line have the following formulas:

Signal Reference Bit Line=0.5*VDD*Cmem/(Cbl+Cmem)

Signal True Bit Line=VDD*Cmem/(Cbl+Cmem)

FIG. 3 shows a representation of the voltage levels of different signalsas a function of time, in the case of a refresh of 1. FIG. 4 representsthe same signals as a function of time, in the case of refresh of 0. Inboth figures, it can be seen how the voltage levels at the first memorycell node and second memory cell node are equalized to obtain a singlevoltage level value. After this first voltage equalization step, asecond voltage equalization of the first memory cell node and secondmemory cell node with the reference bit line is performed. In the caseof the refresh of 1, shown in FIG. 3, a signal difference is obtained,which is visible in FIG. 3. On the contrary, in the case of the refreshof 0 shown in FIG. 4, after the second voltage equalization, the voltagedifference obtained is essentially nil.

As has become apparent from the description above, a memory circuit 20according to an embodiment of the present invention presents severaladvantages. The reference signal that is obtained has the property ofalways tracking the actual signal and the bit line of the capacitor ofthe memory cell. Further, contrary to the conventional memory devicesaccording to the art, no reference WL bit line is necessary, so that theextra stress on the charge pump is reduced. The memory circuit 20according to an embodiment of the present invention allows reducing thesilicon area overhead, thus allowing to obtain an efficient area design.Finally, no power supply voltage VDD/2 is required to pre-charge thememory cell nodes.

The foregoing description of the specific embodiments will so fullyreveal the general nature of the invention that others can, by applyingcurrent knowledge, readily modify and/or adapt for various applicationsof such specific embodiments without departing from the generic concept,and, therefore, such adaptations and modifications should and areintended to be comprehended within the meaning and range of equivalentsof the disclosed embodiments. It is to be understood that thephraseology or terminology employed herein is for the purpose ofdescription and not of limitation. Therefore, while the invention hasbeen described in terms of embodiments, the person skilled in the artwill recognize that these embodiments can be practiced with modificationwithin the spirit and scope of the appended claims.

1. A memory circuit comprising: a first memory cell node comprising afirst memory cell node capacitor electrically coupled to a first memorycell node transistor, a second memory cell node comprising a secondmemory cell node capacitor electrically coupled to a second memory cellnode transistor, a pre-charging circuit that pre-charges said firstmemory cell node to a first voltage level and said second memory cellnode to a second voltage level, respectively, a reference memory cellcomprising a first reference cell transistor, a second reference celltransistor, and an equalizing transistor that is arranged between saidfirst reference cell transistor and said second reference celltransistor, and a sense amplifier that detects a potential differencebetween a reference bit line from said reference memory cell and a bitline from said first or second memory cell node during a read operationof the memory circuit, wherein said first reference cell transistor,said second reference cell transistor and said equalizing transistorperform a first voltage equalization of said first memory cell node andsaid second memory cell node at a predetermined voltage and a secondvoltage equalization of said first memory cell node and said secondmemory cell node based on one of a first reference signal and a secondreference signal that are respectively input to said first referencecell transistor and said second reference cell transistor.
 2. The memorycircuit according to claim 1, wherein said first memory cell nodetransistor electrically couples said first memory cell node capacitor toa first bit line when a first word line is active, and said secondmemory cell node transistor electrically couples said second memory cellnode capacitor to a second bit line when a second word line is active.3. The memory circuit according to claim 1, wherein said first voltageequalization of said first memory cell node and said second memory cellnode at a predetermined voltage is performed when said equalizingtransistor is turned on.
 4. The memory circuit according to claim 1,wherein said predetermined voltage is essentially half of said firstvoltage level.
 5. The memory circuit according to claim 1, wherein avoltage level on the obtained reference bit line is essentially half ofthe corresponding signal on the true bit line.
 6. The memory circuitaccording to claim 1, wherein the sense amplifier comprises a logic gatearrangement and a transistor to which a signal is input.
 7. A method ofsense amplifying in a memory circuit, wherein said memory circuitcomprises a first memory cell node comprising a first memory cell nodecapacitor electrically coupled to a first memory cell node transistor,and a second memory cell node comprising a second memory cell nodecapacitor electrically coupled to a second memory cell node transistor,said method comprises: pre-charging said first memory cell node to afirst voltage level and said second memory cell node to a second voltagelevel, respectively, performing, by an equalizing transistor, a firstvoltage equalization of said first memory cell node and said secondmemory cell node at a predetermined voltage and a second voltageequalization of said first memory cell node and said second memory cellnode based on one of a first reference signal and a second referencesignal that are respectively input to a first reference cell transistorand a second reference cell transistor of a reference memory cellfurther comprising said equalizing transistor that is arranged betweensaid first reference cell transistor and said second reference celltransistor, and detecting, by a sense amplifier, a potential differencebetween a reference bit line from said reference memory cell and a bitline from said first or second memory cell node during a read operationof the memory circuit.
 8. The method according to claim 7, furthercomprising: electrically coupling, by said first memory cell nodetransistor, said first memory cell node capacitor to a first bit linewhen a first word line is active, and electrically coupling, by saidsecond memory cell node transistor, said second memory cell nodecapacitor to a second bit line when a second word line is active.